Authors Dariusz Czułek - Central Office of Measures (Główny Urząd Miar)
Two strategic projects realized in the Length Laboratory was discussed: "Participation in the project of using MEMS to provide dimensional standards for users of atomic force microscopes" and "Participation in the project of developing a Polish compact laser length / frequency standard – a part of the interferometer for industrial purposes".
[1] T. Dziomba, L. Koenders, G. Wilkening: Standardization in dimensional nanometrology: development of a calibration guideline for Scanning Probe Microscopy. Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59650C (2005).
[2] M. Moczała, W. Majstrzyk, A. Sierakowski, R. Dobrowolski, P. Grabiec, T. Gotszalk: Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopy. Micron, vol. 84 (2016), p. 1-6.
[3] T. J. Quinn: Practical realization of the definition of the meter, including recommended radiations of the other optical frequency standards (2001) – international report. Metrologia, vol. 40 (2003), p. 103-133.
